feat: Gen.3 power-on self test (#11192) (!7) · Merge requests · MSK-SW / Infrastructure and Support / Laser Diode Driver / LDD firmware

Martin Christoph Hierholzer requested to merge mhier/wip-sprint-2023-autumn into master Oct 12, 2023

Tests for presence of hardware patch wire which is part of the Gen.3 interlock scheme. The patch wire forces the DAC to be cleared while a (latched) interlock signal is present. The P.O.S.T. will check that driving the DAC at boot time does not result in a significant readback value at the ADC.

feat: Gen.3 power-on self test (#11192)

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