testDeviceInitialisationHandler: convert globals used by different threads into atomics to avoid data races (tsan was complaining)

allows to control whether to wait for device recoveries in stepApplication

This is not correlated to the new feature implemented in this branch. It
was needed to compile this version.

Fix changes broken by renaming to ExceptionDummyBackend in DeviceAccess.

They return as soon as the condition is fulfilled, so there is no harm in having long timeouts in case the tests are successful. The only drawback is that it takes longer in case of errors.

test was broken by its design, which became now evident with the proper initial value propagation

 - Add missing required dependencies for boost
 - Remove deprecated header. Also not needed on xenial

supposedly fixed implementation, but tests are conceptually broken and/or implementation cannot be terminated

- fixed bug that there was a nullptr exception handler in the list with default value from constructor (caused all ApplicationCore to fail)

implemented first interface change in DeviceModule to support initialisationHandlers. Test in place but failing due to missing implementation.