- Feb 04, 2020
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Martin Christoph Hierholzer authored
this was violating thread safety of accessors, since the mainLoopWrapper() was reading initial values at the same time as the test thread was reading the same accessors.
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- Feb 03, 2020
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Martin Killenberg authored
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Martin Killenberg authored
solved a race condition in testTrigger. Initial value was not considered. Still race conditions remaining.
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- Jan 31, 2020
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Jens Georg authored
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Automated MSK Jenkins User authored
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- Jan 29, 2020
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vargheseg authored
Changes should address timing related failures in the tests.
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vargheseg authored
Fixture teardown functions now ensure the device dummybackends do no throw on read or write.
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Martin Killenberg authored
- Exception handling decorator does not allow to leave testable mode before devices are up - Test facility makes sure that testable mode counter is zero at the end of startApplication()
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- Jan 28, 2020
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Automated MSK Jenkins User authored
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- Jan 27, 2020
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Martin Killenberg authored
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Martin Killenberg authored
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Martin Killenberg authored
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Martin Killenberg authored
activated tests for exception flag propagation with direct connection Device->ApplicationModule (part of #102)
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vargheseg authored
All variables from the cs to device have been initialized with a non zero default before the test starts.
- Jan 26, 2020
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Martin Killenberg authored
- first part of #102 - Existing tests passing - New tests not activated yet
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- Jan 24, 2020
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Martin Killenberg authored
Tests for Data invalidation propogation
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Martin Killenberg authored
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Martin Killenberg authored
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Christoph Kampmeyer authored
- Basic structure of test application - Added modules - Refactoring of StatusMonitor to provide a non-templated base class - Needs follow-up, for status see issue #14 and the linked follow-up ticket
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- Jan 23, 2020
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vargheseg authored
- testInvalidTrigger - testDeviceReadFailure - testreadDeviceWithTrigger - testConsumingFanout - testDataFlowOnDeviceException
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vargheseg authored
- device1 -> device1DummyBackend. - device2 -> device2DummyBackend.
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vargheseg authored
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vargheseg authored
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vargheseg authored
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vargheseg authored
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vargheseg authored
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vargheseg authored
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vargheseg authored
Test application structure: CS +---> threaded fanout +------------------+ + v +--------+ +Device1+ | | | v +--+ | CS <---------+ Module1 <-------+ v | | ^ +Consuming | | +---------+ fanout | +----+ + + | v Device2 | | CS <---------+ Module2 | | | | CS <-------------------------------+ | | | CS <---------+ Trigger <----------------------+ ^ | + CS
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Martin Christoph Hierholzer authored
Fix broken propagation of initial values
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Martin Christoph Hierholzer authored
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Martin Christoph Hierholzer authored
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Martin Christoph Hierholzer authored
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Martin Christoph Hierholzer authored
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Martin Christoph Hierholzer authored
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Martin Christoph Hierholzer authored
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Martin Christoph Hierholzer authored
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Martin Christoph Hierholzer authored
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Martin Christoph Hierholzer authored
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Martin Christoph Hierholzer authored
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