calling device.getOneDRegisterAccessor<double> causses an error in server,
	when having uder type string

exception handling spec: swap C.3.3.7 and C.3.3.8

testDeviceInitialisationHandler: convert globals used by different threads into atomics to avoid data races (tsan was complaining)

fix tsan complaining about incrementing/decrementing testableMode_deviceInitialisationCounter outside testable mode

The previous order was causing actual race conditions, see #173.

should not make a real difference, it is just more logical like this

	firt test D9 b for ThreadedFanOut

[wip #173] move clearing error status flag in control system after the point where operations are allowed again (fixes race condition)

A corresponding update of the specification will follow.

	Write tests for initial value initial value specification D.8

- Also removed race conditions in the test.

Spec data validity propagation v1.0 rc2

Print test name.